UVC Epitaxy EPI
The quality of UVC-LED epitaxial wafers directly determines the brightness and electrical grade of its chip products. Therefore, UVC epitaxy has the characteristics of high technical threshold, strict control requirements, and high quality requirements.
Our company has a number of epitaxial technology patents, equipped with high-precision production and testing equipment, and strictly controls the quality of the process. The product wavelength is 260-280nm. The grown AIN and AlGaN crystals are of good quality, less cracks, and high reliability.
Product introduction
The quality of UVC-LED epitaxial wafers directly determines the brightness and electrical grade of its chip products. Therefore, UVC epitaxy has the characteristics of high technical threshold, strict control requirements, and high quality requirements. The company has a number of epitaxial technology patents, equipped with high-precision production and testing equipment, and strictly controls the quality of the process. The product wavelength is 260-280nm. The grown AIN and AlGaN crystals are of good quality, less cracks, and high reliability.
Technical Points:
- LED Chip: Single Wave Ultraviolet Chip
- High thermal conductivity aluminum nitride ceramic support, low thermal resistance, high reliability
- Built-in Zener Diode, anti-voltage protection
- Lead free product RoHs compliant.
AlN Crystal Quality Requirements:
| Parameters | Performance Requirement | Remarks |
| XRD 002 | ≤100arcsec | – |
| XRD 102 | ≤300arcsec | – |
| Roughness RMS | ≤2nm | 3um*3um |
AlGaN Crystal Quality Requirements:
| Parameters | Performance Requirement | Remarks |
| XRD 002 | ≤200arcsec | – |
| XRD 102 | ≤400arcsec | – |
| Roughness RMS | ≤2nm | 3um*3um |
UVC-LED Requirements:
| Project | Requirement |
| Epitaxy emission wavelength | 260nm-280nm |
| Wavelength uniformity | ≤3.5nm |
| Surface resistance | ≤150 |
Optical Parameters:
| Project | Requirement |
| Voltage Vf（1μA）/V | ≥4.0 |
| Leakage current (-5V)/μA | ≤1 |
| Output power (40mA) | ≥5.5mW |
| Half width | ≤12 |
Appearance Standard:
| Item | Defect limit | Remarks |
| Edge exclusion | Quality in the area within 3mm from the wafer edge (within 6mm from the primary flat edge) is not guaranteed | – |
| Surface Crack | None | – |
| Surface Haze | None | – |
| Hillock | <10ea@x50 optical microscope(2.6mm x 2mm area) | Ave.9 pts |
| Scratch | ≤10 ea &≤1cm | – |
| Contamination | Larger than 1mm dia.:Not applicableLess than 1mm dia.:Less than 10ea | – |
Test Reports:
Below is the latest test reports by Third-party authority, you can download to see the results.
Let's Work Together!
Whether it is ordering a UVC sample to take your design to the next step or planning to start a new UVC project this is where to get connected with what you need.
Headquarter
Building 14, Zone B, Digital Economy Industrial Park, No.136 Yuhai East Road, Hangzhou Bay New District, Ningbo, Zhejiang Province
(+86) 0574-58010899
project@annsemic.com
Branch
No. 425 Block A, Huafeng Internet + Creative Park, Gonghe Industrial Road, Xixiang Street, Bao’an District, Shenzhen, Guangdong Provice
(+86) 136 3165 9615
sales@annsemic.com
