UVC Epitaxy EPI

The quality of UVC-LED epitaxial wafers directly determines the brightness and electrical grade of its chip products. Therefore, UVC epitaxy has the characteristics of high technical threshold, strict control requirements, and high quality requirements.

Our company has a number of epitaxial technology patents, equipped with high-precision production and testing equipment, and strictly controls the quality of the process. The product wavelength is 260-280nm. The grown AIN and AlGaN crystals are of good quality, less cracks, and high reliability.

Product introduction

The quality of UVC-LED epitaxial wafers directly determines the brightness and electrical grade of its chip products. Therefore, UVC epitaxy has the characteristics of high technical threshold, strict control requirements, and high quality requirements. The company has a number of epitaxial technology patents, equipped with high-precision production and testing equipment, and strictly controls the quality of the process. The product wavelength is 260-280nm. The grown AIN and AlGaN crystals are of good quality, less cracks, and high reliability.

UVC Epitaxy

Technical Points:

  • LED Chip: Single Wave Ultraviolet Chip
  • High thermal conductivity aluminum nitride ceramic support, low thermal resistance, high reliability
  • Built-in Zener Diode, anti-voltage protection
  • Lead free product RoHs compliant.

AlN Crystal Quality Requirements:

 

Parameters Performance Requirement Remarks
XRD 002 ≤100arcsec
XRD 102 ≤300arcsec
Roughness RMS ≤2nm 3um*3um

AlGaN Crystal Quality Requirements:

 

Parameters Performance Requirement Remarks
XRD 002 ≤200arcsec
XRD 102 ≤400arcsec
Roughness RMS ≤2nm 3um*3um

UVC-LED Requirements:

 

Project Requirement
Epitaxy emission wavelength 260nm-280nm
Wavelength uniformity ≤3.5nm
Surface resistance ≤150

Optical Parameters:

 

Project Requirement
Voltage Vf(1μA)/V ≥4.0
Leakage current (-5V)/μA ≤1
Output power (40mA) ≥5.5mW
Half width ≤12

Appearance Standard:

 

Item Defect limit Remarks
Edge exclusion Quality in the area within 3mm from the wafer edge (within 6mm from the primary flat edge) is not guaranteed
Surface Crack None
Surface Haze None
Hillock <10ea@x50 optical microscope(2.6mm x 2mm area) Ave.9 pts
Scratch ≤10 ea &≤1cm
Contamination Larger than 1mm dia.:Not applicableLess than 1mm dia.:Less than 10ea

Test Reports:

Below is the latest test reports by Third-party authority, you can download to see the results.

 

Let's Work Together!

Whether it is ordering a UVC sample to take your design to the next step or planning to start a new UVC project this is where to get connected with what you need.

Headquarter

Building 14, Zone B, Digital Economy Industrial Park, No.136 Yuhai East Road, Hangzhou Bay New District, Ningbo, Zhejiang Province

(+86) 0574-58010899

project@annsemic.com

Branch

No. 425 Block A, Huafeng Internet + Creative Park, Gonghe Industrial Road, Xixiang Street, Bao’an District, Shenzhen, Guangdong Provice

(+86) 136 3165 9615

sales@annsemic.com